Thick target technique for proton induced ionisation cross-section measurements—a re-evaluation-Reference-Cited by-同舟云学术

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Thick target technique for proton induced ionisation cross-section measurements—a re-evaluation

Published:1978-03 Issue:3 Volume:15 Page:335-339
ISSN:0340-3793
Container-title:Applied Physics
language:en
Short-container-title:Appl. Phys.

Author:

Khan Rashiduzzaman,Crumpton D.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,General Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00896117.pdf

Reference27 articles.

1. G. Deconninck, G. Demortier, F. Bodard: Atomic Energy Rev.13, P. 2, 367 (1975)

2. Md. Rashiduzzaman Khan: Proton Induced X-Rays for Trace Element Analysis, to be published by NRC, AEO, IRAN, 1976

3. G. Basbas, W. Brandt, R. Laubert: Phys. Rev.7, 983 (1973)

4. J.S. Hansen: Phys. Rev.8, 822 (1973)

5. D.H.Madison, E.Merzbacher: Private Communication (1975)

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1. K-X rays induced by helium-like C ions in thick target atoms of different metals;Acta Physica Sinica;2024

2. Multiple ionization effects in M X-ray emission induced by heavy ions;Physics Letters A;2012-03

3. Molybdenum L-shell X-ray production by 350–600keV Xeq+ (q=25–30) ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-05

4. Thick target X-ray yields from proton bombardment;X-Ray Spectrometry;1988-02

5. Proton-induced L X-ray production cross sections and intensity ratios for Gd and Tb in the energy range 250-400 keV;Journal of Physics B: Atomic and Molecular Physics;1987-10-28

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