Characterisation of anodic oxide films on zirconium formed in sulphuric acid: XPS and corrosion resistance investigations-Reference-Cited by-同舟云学术

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Characterisation of anodic oxide films on zirconium formed in sulphuric acid: XPS and corrosion resistance investigations

Published:2016-08-20 Issue:1 Volume:21 Page:203-210
ISSN:1432-8488
Container-title:Journal of Solid State Electrochemistry
language:en
Short-container-title:J Solid State Electrochem

Author:

Sowa Maciej,Łastówka Dobrochna,Kukharenko Andrey I.,Korotin Danila M.,Kurmaev Ernst Z.,Cholakh Seif O.,Simka Wojciech

Funder

Ministerstwo Nauki i Szkolnictwa Wyszego

FASO of Russia

Russian Foundation for Basic Research

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Electrochemistry,Condensed Matter Physics,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/s10008-016-3369-2.pdf

Reference29 articles.

1. Helsen JA, Missirlis Y (2010) Biomaterials: a Tantalus experience. Springer, Berlin

2. Sloppy JD, Lu Z, Dickey EC, Macdonald DD (2013) Growth mechanism of anodic tantalum pentoxide formed in phosphoric acid. Electrochim Acta 87:82–91

3. Macdonald DD (2011) The history of the point defect model for the passive state: a brief review of film growth aspects. Electrochim Acta 56:1761–1772

4. Tun Z, Noël JJ, Shoesmith DW (2008) Anodic oxide growth on Zr in neutral aqueous solution. Pramana–J Phys 71:769–776

5. McRae GA, Maguire MA, Jeffrey CA, Guzonas DA, Brown CA (2002) A comparison of fractal dimensions determined from atomic force microscopy and impedance spectroscopy of anodic oxides on Zr-25Nb. Appl Surf Sci 191:94–105

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