Funder
Spanish Ministry of Economy, Industry and Competitiveness
Generalitat Valenciana
Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,Industrial and Manufacturing Engineering,Software
Reference56 articles.
1. Adly, F., Alhussein, O., Yoo, P. D., Al-Hammadi, Y., Taha, K., Muhaidat, S., et al. (2015). Simplified subspaced regression network for identification of defect patterns in semiconductor wafer maps. IEEE Transactions on Industrial Informatics, 11(6), 1267–1276.
2. Batista, G. E. A. P. A., & Silva, D. F. (2009). How k-nearest neighbor parameters affect its performance. In Argentine symposium on artificial intelligence, Mar de Plata, Argentina (pp. 1–12).
3. Biau, G., Devroye, L., Dujmović, V., & Krzyzak, A. (2012). An affine invariant k-nearest neighbor regression estimate. Journal of Multivariate Analysis, 112, 24–34.
4. Buza, K., Nanopoulos, A., & Nagy, G. (2015). Nearest neighbor regression in the presence of bad hubs. Knowledge-Based Systems, 86, 250–260.
5. Carrano, E. G., Coelho, D. G., Gaspar-Cunha, A., Wanner, E. F., & Takahashi, R. H. (2015). Feedback-control operators for improved Pareto-set description: Application to a polymer extrusion process. Engineering Applications of Artificial Intelligence, 38, 147–167.
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