Determination of carbon and oxygen in polysilicon using a nuclear microprobe-Reference-Cited by-同舟云学术

Determination of carbon and oxygen in polysilicon using a nuclear microprobe

Published:1987-07 Issue:2 Volume:118 Page:89-98
ISSN:0236-5731
Container-title:Journal of Radioanalytical and Nuclear Chemistry Letters
language:en
Short-container-title:Journal of Radioanalytical and Nuclear Chemistry Letters

Author:

Trocellier P.,Cabanel C.,Pastol J. L.,Revel G.

Publisher

Springer Science and Business Media LLC

Subject

Health, Toxicology and Mutagenesis,Public Health, Environmental and Occupational Health,Spectroscopy,Pollution,Radiology, Nuclear Medicine and imaging,Nuclear Energy and Engineering,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF02166265.pdf

Reference12 articles.

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2. D. Hania, Thèse de Doctorat de 3ème cycle, Spécialité Energétique, Université Paris VII, 1984; G. Revel, D. Hania, J.-L. Pastol, Proc. M.R.S. Meeting: Polymicrocrystalline and amorphous semiconductors, Strasbourg, France, 1984 /Les Editions de Physique, Les Ulis, France 1984/ 147.

3. R. Baulac, G. Revel, D. Hania, J.-L., Pastol, Nguyen Dinh Huynh, M. Rodot, J.-E., Bouree, C. Leray, Le Quang, Nam, F. Dubrous, M. Bargues, Proc. 5th E.C. Photovoltaic Solar Energy Conference, Kavouri /Athens/, Greece, 1983 /D. Reidel, Dordrecht, Holland 1984/ 1053.

4. S. Pizzini, M. Rustioni, Proc. 6th E.C. Photovoltaic Solar Energy Conf., London, G.B., 1985 /D. Reidel, Dordrecht, Holland, 1986/ 875.

5. H.A. Aulich, L. Bernewitz, H.J. Fencz, H. Pinck, F.W. Schule, Proc. M.R.S. Meeting: Poly-microcrystalline and amorphous semiconductors, Strasbourg, France, 1984 /Les Editions de Physique, Les Ulis, France 1984/ 175.

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1. The nuclear microprobe: A complementary tool to NAA characterization;Journal of Radioanalytical and Nuclear Chemistry;1997-03

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3. Materials applications of nuclear microprobes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04

4. Seven years of research using the Bruyeres le Chatel microprobe facility: A review;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04

5. Localization of the electrical activity of structural defects in polycrystalline silicon;Journal of Applied Physics;1990-02