Photoelectric microscopes in comparators for engraved length measures-Reference-Cited by-同舟云学术

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Photoelectric microscopes in comparators for engraved length measures

Published:1982-05 Issue:5 Volume:25 Page:387-389
ISSN:0543-1972
Container-title:Measurement Techniques
language:en
Short-container-title:Meas Tech

Author:

Trishin N. V.,Kayak L. K.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Instrumentation

Link

http://link.springer.com/content/pdf/10.1007/BF00825084.pdf

Reference10 articles.

1. M. L. Brzhezinskii et al., Tr. VNIIM, No. 78 (138) (1965).

2. P. E. Ciddor, Metrologia, No. 4 (1971).

3. V. M. Sikharulidze et al., Izmer. Tekh., No. 7 (1972).

4. V. M. Sikharulidze et al., Izmer. Tekh., No. 11 (1973).

5. V. M. Sikharulidze, Abstracts for the Third Republican Conference on Metrology, Part 1 [in Russian], Metsniereba, Tbilisi (1974).

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