XTEM study of low-energy ion-beam synthesized Ge nanoclusters inside SiOx matrix-Reference-Cited by-同舟云学术

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XTEM study of low-energy ion-beam synthesized Ge nanoclusters inside SiOx matrix

Published:2021-02-05 Issue:1 Volume:44 Page:
ISSN:0250-4707
Container-title:Bulletin of Materials Science
language:en
Short-container-title:Bull Mater Sci

Author:

GUNDANNA SUSHEEL KUMAR,GUHA PUSPENDU,SUNDARAVEL B,BHATTA UMANANDA M^ORCID

Funder

UGC-DAE Consortium for Scientific Research, University Grants Commission

Publisher

Springer Science and Business Media LLC

Subject

Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/s12034-020-02325-x.pdf

Reference27 articles.

1. King Y C, King T J and Hu C 2001 IEEE Trans. Electron Devices 48 696

2. Masuda K, Yamamoto M, Kanaya M and Kanemitsu Y 2002 J. Non-Cryst. Solids 299 1079

3. Kanemitsu Y, Uto H, Masumoto Y and Maeda Y 1992 Appl. Phys. Lett. 61 2187

4. Shcheglov K V, Yang C M, Vahala K J and Atwater H A 1995 Appl. Phys. Lett. 66 745

5. Ekimov A 1996 J. Lumin. 70 1

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