Investigation of structural and electrical properties of ITO thin films and correlation to optical parameters extracted using novel method based on PSO algorithm
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanics of Materials,General Materials Science
Link
https://link.springer.com/content/pdf/10.1007/s12034-022-02845-8.pdf
Reference51 articles.
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5. Afre R A, Sharma N, Sharon M and Sharon M 2018 Rev. Adv. Mater. Sci. 51 79
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