1. J.W. Beletic, R. Blank, D. Gulbransen, D. Lee, M. Loose, E.C. Piquette, T. Sprafke, W.E. Tennant, M. Zandian, and J. Zino, Proc. SPIE (2008). pp. 70210H
2. V.C. Lopes, A.J. Syllaios, and M.C. Chen, Semicond. Sci. Technol. 8, 824 (1993)
3. J. Schuster, R.E. DeWames, E.A. DeCuir Jr., E. Bellotti, and P.S. Wijewarnasuriya, Appl. Phys. Lett. 107, 023502 (2015)
4. R.E. DeWames, D.D. Edwall, M. Zandian, L.O. Bubulac, J.G. Pasko, W.E. Tennant, J.M. Arias, and A. D’Souza, J. Electron. Mater. 27, 722 (1998)
5. R.E. DeWames, R.T. Littleton, C. Billman, J. Pellegrino, S. Horn, and R. Balcerak, US Workshop on the Physics and Chemistry of II-VI materials, extended abstract (2008), pp. 227