Surface Roughness and Critical Exponent Analyses of Boron-Doped Diamond Films Using Atomic Force Microscopy Imaging: Application of Autocorrelation and Power Spectral Density Functions-Reference-Cited by-同舟云学术

Surface Roughness and Critical Exponent Analyses of Boron-Doped Diamond Films Using Atomic Force Microscopy Imaging: Application of Autocorrelation and Power Spectral Density Functions

Published:2014-06-21 Issue:9 Volume:43 Page:3436-3448
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Gupta S.,Vierkant G. P.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-014-3262-7.pdf

Reference61 articles.

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3. J.C. Angus, P. Koidl, and S. Domitz, Plasma Deposited Thin Films, ed. J. Mort and F. Jansen (Boca Raton, FL: CRC, 1986),

4. P.K. Bachmann and R. Messier, Chem. Eng. News 67, 24 (1989).

5. M.H. Nazare, Properties and Growth of Diamond.EMIS Data Review Series, ed. G. Davies (London: INSPEC, 1994), p. 85.

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