Author:
Zhou Y. D.,Becker C. R.,Selamet Y.,Chang Y.,Ashokan R.,Boreiko R. T.,Aoki T.,Smith David J.,Betz A. L.,Sivananthan S.
Publisher
Springer Science and Business Media LLC
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. C.A. Cabelli, D.E. Cooper, A. Haas, L.J. Kozlowski, G. Bostrup, A.C. Chen, J.D. Blackwell, J.T. Montroy, K. Vural, W.E. Kleinhans, K.W. Hodapp, and D. Hall, Proc. SPIE 4028, 331 (2000).
2. A.L. Betz and R.T. Boreiko, Proc. SPIE 4454, 1 (2001).
3. A.L. Betz, R.T. Boreiko, S. Sivananthan, and Y.D. Zhou, Proc. FAR-IR, SUB-MM &MM Detector Technology Workshop, ed. J. Wolf, J. Farhoomand, and C.R. McCreight, NASA/CP-211408, 2002 (in press).
4. C.R. Becker, V. Latussek, A. Pfeuffer-Jeschke, G. Landwehr, and L.W. Molenkamp, Phys. Rev. B 62, 10353 (2000).
5. R.W. Miles, Properties of Narrow Gap Cadmium-Based Compounds (London: INSPEC, The Institution of Electrical Engineers, 1994), pp. 221–226.
Cited by
30 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献