Ion Bombardment-Induced Stress Mechanism for the Formation of Ag Nanotwinned Films on Si Substrates
Author:
Funder
Emerging Technology Application Program of the Hsinchu Science Park R & D program of Ag Materials Technology Co., LTD
Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s11664-023-10905-w.pdf
Reference29 articles.
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2. B. Wang, H. Idrissi, H. Shi, M.-S. Colla, S. Michotte, J.-P. Raskin, T. Pardoen, and D. Schryvers, Texture-dependent twin formation in nanocrystalline thin Pd films. Scripta Mater. 66(11), 866 (2012).
3. B. Amin-Ahmadi, H. Idrissi, M. Galceran, M.-S. Colla, J.-P. Raskin, T. Pardoen, S. Godet, and D. Schryvers, Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films. Thin Solid Films 539, 145 (2013).
4. K. Han, J. Hirth, and J. Embury, Modeling the formation of twins and stacking faults in the Ag-Cu system. Acta Mater. 49(9), 1537 (2001).
5. X. Zhang, A. Misra, H. Wang, T. Shen, M. Nastasi, T. Mitchell, J. Hirth, R. Hoagland, and J. Embury, Enhanced hardening in Cu/330 stainless steel multilayers by nanoscale twinning. Acta Mater. 52(4), 995 (2004).
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