Characterization of (211) and (100) CdTe Layers Grown on Si Substrates by Metalorganic Vapor-Phase Epitaxy-Reference-Cited by-同舟云学术

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Characterization of (211) and (100) CdTe Layers Grown on Si Substrates by Metalorganic Vapor-Phase Epitaxy

Published:2017-08-02 Issue:11 Volume:46 Page:6704-6708
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Yasuda K.,Niraula M.,Kojima M.,Kitagawa S.,Tsubota S.,Yamaguchi T.,Ozawa J.,Agata Y.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/article/10.1007/s11664-017-5703-6/fulltext.html

Reference14 articles.

1. K. Yasuda, M. Niraula, H. Kusama, Y. Yamamoto, M. Tominaga, K. Takagi, Y. Agata, and K. Suzuki, IEEE Trans. Nucl. Sci. 52, 1951 (2005).

2. K. Yasuda, M. Niraula, K. Noda, M. Yokota, H. Ohashi, K. Nakamura, M. Omura, I. Shingu, S. Minoura, R. Tanaka, and Y. Agata, IEEE Electron Device Lett. 27, 890 (2006).

3. M. Niraula, K. Yasuda, N. Fujimura, T. Tachi, H. Inuzuka, S. Namba, T. Kondo, S. Muramatsu, and Y. Agata, IEEE Trans. Nucl. Sci. 59, 3201 (2012).

4. M. Niraula, K. Yasuda, H. Ohnishi, K. Eguchi, H. Takahashi, K. Noda, and Y. Agata, J. Cryst. Growth 284, 15 (2005).

5. M. Niraula, K. Yasuda, H. Ohnishi, H. Takahashi, K. Eguchi, K. Noda, and Y. Agata, J. Electron. Mater. 35, 1257 (2006).

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1. Large-area epitaxial CdTe(100) films grown on GaAs(100) substrates: MBE growth and substrate temperature effect;Journal of the Korean Physical Society;2021-11-22

2. Metalorganic Vapor Phase Epitaxy of Thick and Uniform Single Crystal CdTe Epitaxial Layers on (211) Si Substrates for X-ray Imaging Detector Development;Journal of Electronic Materials;2019-09-05

3. Cadmium telluride and cadmium zinc telluride;Single Crystals of Electronic Materials;2019

4. Postgrowth Annealing of MOVPE-Grown Single-Crystal CdTe Epilayers on (211) Si Substrates;IEEE Transactions on Nuclear Science;2018-08

5. Determining the sub-surface damage of CdTe single crystals after lapping;Journal of Materials Science: Materials in Electronics;2018-03-29

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