A Novel Stress Characterization Technique for the Development of Low-Stress Ohmic Contacts to HgCdTe-Reference-Cited by-同舟云学术

A Novel Stress Characterization Technique for the Development of Low-Stress Ohmic Contacts to HgCdTe

Published:2009-04-21 Issue:8 Volume:38 Page:1698-1706
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

D’Orsogna D.,Lamarre P.,Bellotti E.,Barbone P. E.,Smith F.,Fulk C.,LoVecchio P.,Reine M. B.,Tobin S. P.,Markunas J.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-009-0790-7.pdf

Reference20 articles.

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3. A. Rogalski, Rep. Prog. Phys. 68, 2267 (2005)

4. A. Rogalski, Infrared Photon Detectors (SPIE—The International Society for Optical Engineering, 1995), ISBN 0-8194-1798-X.

5. P. Costa, P. Tribolet, and G. Destefanis, Recent Results on SOFRADIR HgCdTe Detectors. Available at http://www.sofradir.com/_pdf/recent_results_on_Sofradir_HgCdTe_detectors.pdf .

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