Author:
Kohama Kazuyuki,Ito Kazuhiro,Mori Kenichi,Maekawa Kazuyoshi,Shirai Yasuharu,Murakami Masanori
Publisher
Springer Science and Business Media LLC
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. S. Tsukimoto, M. Moriyama, K. Ito, and M. Murakami, J. Electron. Mater., 34, 592 (2005). doi: 10.1007/s11664-005-0070-0
2. K. Kohama, K. Ito, S. Tsukimoto, K. Mori, K. Maekawa, and M. Murakami, J. Electron. Mater., 37, 1148 (2008). doi: 10.1007/s11664-008-0482-8
3. K. Kohama, K. Ito, S. Tsukimoto, K. Mori, K. Maekawa, and M. Murakami, Mater. Trans., 49, 1987 (2008). doi: 10.2320/matertrans.MAW200809
4. W.-K. Chu, J.W. Mayer, and M.-A. Nicolet, Backscattering Spectrometry, San Diego: Academic Press, 1978, pp. 91-92
5. R.A. Young, The Rietveld Method, New York: Oxford University Press, 1993, pp. 22
Cited by
16 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献