Characterization of ZnO Films Grown by Chemical Vapor Deposition as Active Layer in Pseudo-MOSFET-Reference-Cited by-同舟云学术

Characterization of ZnO Films Grown by Chemical Vapor Deposition as Active Layer in Pseudo-MOSFET

Published:2021-06-10 Issue: Volume: Page:
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Ramos-Carrazco A.,Gallardo-Cubedo J. A.,Vera-Marquina A.^ORCID,Leal-Cruz A. L.,Noriega J. R.,Zuñiga-Islas C.,Rojas-Hernández A. G.,Gomez-Fuentes R.,Berman-Mendoza D.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://link.springer.com/content/pdf/10.1007/s11664-021-09038-9.pdf

Reference50 articles.

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