Effectuality of Barrier Height Inhomogeneity on the Current–Voltage–Temperature Characteristics of Metal Semiconductor Structures with CdZnO Interlayer-Reference-Cited by-同舟云学术

Effectuality of Barrier Height Inhomogeneity on the Current–Voltage–Temperature Characteristics of Metal Semiconductor Structures with CdZnO Interlayer

Published:2018-07-11 Issue:10 Volume:47 Page:6059-6066
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Taşçıoğlu İlke^ORCID,Tan Serhat Orkun,Yakuphanoğlu Fahrettin,Altındal Şemsettin

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/article/10.1007/s11664-018-6495-z/fulltext.html

Reference43 articles.

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3. E.H. Rhoderick, Metal-Semiconductor Contacts (London: Oxford University Press, 1978).

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