Synchrotron X-ray Based Characterization of CdZnTe Crystals-Reference-Cited by-同舟云学术

Synchrotron X-ray Based Characterization of CdZnTe Crystals

Published:2007-07-06 Issue:8 Volume:36 Page:1092-1097
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Duff Martine C.,Hunter Douglas B.,Nuessle Patterson,Black David R.,Burdette Harold,Woicik Joseph,Burger Arnold,Groza Michael

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-007-0181-x.pdf

Reference19 articles.

1. N. Motta, A. Balzarottie, P. Letardi, A. Kisiel, M.T. Czyzyk, M. Zimnal-Starnawska, M. Podgorny, J. Crystal Growth,1985, 72, 205.

2. M.S. Goorsky, H. Yoon, M. Ohler, K. Liss, SPIE,1999, 3768, 108.

3. V. Koteski, H. Hass, E. Holub-Frappe, N. Ivanovic, H.-E. Mahnke, J. Alloys Compounds,2004, 371, 138–141.

4. G.A. Carini, A.E. Bolotnikov, G.S. Camarda, G.W. Wright, L. Li, R.B. James, Appl. Phys. Lett.,2006, 88, 143515.

5. L. Li, F. Lu, K. Shah, M. Squillante, L. Cirinano, W. Yao, R.W. Olson, P. Luke, Y. Nemirovsky, A. Burger, G. Wright, R.B. James, Nucl. Sci. Symp. Conf. Rec. IEEE,2001, 4, 2396.

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