A Failure Mode in Dense Infrared Detector Arrays Resulting in Increased Dark Current-Reference-Cited by-同舟云学术

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A Failure Mode in Dense Infrared Detector Arrays Resulting in Increased Dark Current

Published:2016-04-08 Issue:9 Volume:45 Page:4631-4639
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Pinkie Benjamin,Bellotti Enrico

Funder

U.S. Army Research Laboratory

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-016-4476-7.pdf

Reference25 articles.

1. M.A. Kinch, Proc. SPIE 9070, 907032 (2014).

2. X. Brenière, L. Rubaldo, and F. Dupont, Proc. SPIE 9070, 90702W (2014).

3. Y. Reibel, N. Pere-Laperne, T. Augey, L. Rubaldo, G. Decaens, M.L. Bourqui, S. Bisotto, O. Gravrand, G. Destefanis, G. Druart, and N. Guerineau, Proc. SPIE 9070, 907034 (2014).

4. P. Castelein, N. Baier, O. Gravrand, L. Mollard, D. Brellier, F. Rochette, A. Kerlain, L. Rubaldo, Y. Reibel, and G. Destefanis, Proc. SPIE 9070, 90702Y (2014).

5. R. Breiter, D. Eich, H. Figgemeier, H. Lutz, J. Wendler, I. Rülich, S. Rutzinger, and T. Schallenberg, Proc. SPIE 9070, 90702V (2014).

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