Understanding the Evolution of CdTe Buffer Layer Surfaces on ZnTe/Si(211) and GaAs(211)B During Cyclic Annealing-Reference-Cited by-同舟云学术

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Understanding the Evolution of CdTe Buffer Layer Surfaces on ZnTe/Si(211) and GaAs(211)B During Cyclic Annealing

Published:2012-06-28 Issue:10 Volume:41 Page:2975-2980
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Jaime-Vasquez M.,Jacobs R.N.,Nozaki C.,Benson J.D.,Almeida L.A.,Arias J.,Pellegrino J.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-012-2169-4.pdf

Reference16 articles.

1. M. Jaime-Vasquez, R.N. Jacobs, J.D. Benson, A.J. Stoltz, L.A. Almeida, L.O. Bubulac, Y. Chen, and G. Brill, J. Electron. Mater. 39, 951 (2010).

2. L.A. Almeida, L. Hirsch, M. Martinka, P.R. Boyd, and J.H. Dinan, J. Electron. Mater. 30, 608 (2001).

3. R.N. Jacobs, L.A. Almeida, J. Markunas, J. Pellegrino, M. Groenert, M. Jaime-Vasquez, N. Mahadik, C. Andrews, S.B. Qadri, T. Lee, and M. Kim, J. Electron. Mater. 37, 1480 (2008).

4. R.N. Jacobs, J. Markunas, J. Pellegrino, L.A. Almeida, M. Groenert, M. Jaime-Vasquez, N. Mahadik, C. Andrews, and S.B. Qadri, J. Cryst. Growth 310, 2960 (2008).

5. Y. Chen, S. Farrell, G. Brill, P. Wijewarnasuriya, and N. Dhar, J. Cryst. Growth 310, 5303 (2008).

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of structural and optical characteristics of low temperature nucleated thick ZnTe epitaxy on GaAs (211) substrates by MBE;Optical Materials;2024-10

2. Dynamic Curvature and Stress Studies for MBE CdTe on Si and GaAs Substrates;Journal of Electronic Materials;2015-05-27

3. Impact of Tellurium Precipitates in CdZnTe Substrates on MBE HgCdTe Deposition;Journal of Electronic Materials;2014-08-14

4. Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrates;Journal of Electronic Materials;2013-10-08

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