Use of ellipsometry to characterize the surface of HgCdTe-Reference-Cited by-同舟云学术

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Use of ellipsometry to characterize the surface of HgCdTe

Published:1993-08 Issue:8 Volume:22 Page:887-898
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Rhiger David R.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02817502.pdf

Reference78 articles.

1. R.M.A. Azzam and N.M. Bashara,Ellipsometry and Polarized Light, North-Holland, Amsterdam (1977).

2. R.F. Spanier,Industrial Research 17, (9) 73 (1975).

3. R.J. Kutko,Solid State Technol. 21, (2), 43 (1978).

4. E.D. Palik, ed.,Handbook of Optical Constants of Solids, Academic Press, Orlando (1985).

5. E.D. Palik, ed.,Handbook of Optical Constants of Solids II, Academic Press, Orlando (1991).

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