Analyse von chemisch behandelten Metalloberflächen durch ISS/SIMS-Reference-Cited by-同舟云学术

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Analyse von chemisch behandelten Metalloberflächen durch ISS/SIMS

Published:1983-01 Issue:3 Volume:314 Page:260-264
ISSN:0016-1152
Container-title:Fresenius' Zeitschrift für analytische Chemie
language:de
Short-container-title:Z. Anal. Chem.

Author:

Puderbach Herbert

Publisher

Springer Science and Business Media LLC

Subject

Clinical Biochemistry,General Materials Science,General Medicine,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00516816.pdf

Reference16 articles.

1. Schoenemann R, Germscheid H-G, Puderbach H (1972) Oberflächentechnik 21:23

2. Puderbach H (1972) Beitr Elektronenmikroskop Direktabb Oberfl 5:671

3. Puderbach H, Schoenemann R (1974) Metalloberfläche 28:81

4. Puderbach H, Schoenemann R (1975) Metalloberfläche 29:107

5. Puderbach H, Friedemann W, Kamino T (1976) Metalloberfläche 30:401

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4. Thin film analysis of conversion layers on aluminium;Spectrochimica Acta Part B: Atomic Spectroscopy;1985-01

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