On certain potential improvements in the metrological traceability of linear measurements in the nanometric range-Reference-Cited by-同舟云学术

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On certain potential improvements in the metrological traceability of linear measurements in the nanometric range

Published:2009-11 Issue:11 Volume:52 Page:1159-1166
ISSN:0543-1972
Container-title:Measurement Techniques
language:en
Short-container-title:Meas Tech

Author:

Danelyan A. G.,Garibashvili D. I.,Kankiya R. R.,Mkrtychyan S. A.,Shotashvili S. V.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Instrumentation

Link

http://link.springer.com/content/pdf/10.1007/s11018-010-9413-1.pdf

Reference4 articles.

1. S. A. Darznek et al., “Laser interferometric meter of nanometric displacements,” Tr. IOF im. A. M. Prokhorova RAN, 62, 14 (2006).

2. M. T. Postek, “Metrology in the nanometric range,” Vest. Tekhnich. Regulir., No. 7 (44) (2007); “Nanometer-scale metrology,” Proc. SPIE, 4608, 84 (2002).

3. Yu. A. Novikov, A. V. Rakov, and P. A. Todua, “Nanotechnology and nanometrology,” Tr. IOF im. A. M. Prokhorova RAN, 62, 3 (2006).

4. H. Gibbs, Optical Bistability. Control of Light by Means of Light [Russian Translation], Mir, Moscow (1988).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Metrological Traceability of Measurement Results in Pharmaceutical and Chemical Sciences: Selection and Use of Certified Reference Materials;Journal of the Brazilian Chemical Society;2014

2. Practical implementation of a new definition of the unit of length;Measurement Techniques;2010-06-09

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