1. D. J. Whitehouse, Handbook of Surface and Nanometrology, CRC Press (2001).
2. B. Muralikrishnan and J. Raga, Computational Surface and Roundness Metrology, Springer, London (2009).
3. V. G. Lysenko and V. S. Luk’yanov, “Identifying irregularities in the topography of a surface by means of a spatial current averaging operator,” Izmer. Tekhn., No. 2, 13–16 (1982).
4. ISO 11562:1996, Geometrical Product Specification (GPS), Surface Texture: Profile Method, Metrological Characteristics of Phase Corrected Filters, International Organization for Standardization.
5. ISO/TS 16610–1:2015, Geometrical Product Specification (GPS) – Filtration, P. 1: Overview and Basic Concepts, International Organization for Standardization.