1. C. Poole and F. Owens, Introduction to Nanotechnology [Russian translation], Tekhnosfera, Moscow (2004).
2. G. G. Levin et al., “Use of optical interferometers in a standards complex for determining surface roughness,” in: Abstr. Int. Forum on Nanotechnologies Rusnanotech’09, Oct. 6–8, 2009, Moscow (2009).
3. G. G. Levin et al., “Influence of phase changes on reflection on surface measurements in optical profilometry,” in: Proc. IASTED Int. Conf. ACIT 2010, pp. 279–281.
4. A. G. Lomakin and V. L. Minaev, “Interference profilometry of specularly reflecting surfaces,” Izmer. Tekhn., No. 12, 16–19 (2006);
5. Measur. Techn., 49, No. 12, 1194–1197 (2006).