The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method-Reference-Cited by-同舟云学术

The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method

Published:2013-10 Issue:7 Volume:56 Page:817-822
ISSN:0543-1972
Container-title:Measurement Techniques
language:en
Short-container-title:Meas Tech

Author:

Zablotskii A. V.,Kuzin A. Yu.,Mikheev N. N.,Stepovich M. A.,Todua P. A.,Shirokova E. V.,Filippov M. N.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Instrumentation

Link

http://link.springer.com/content/pdf/10.1007/s11018-013-0288-9.pdf

Reference17 articles.

1. N. N. Mikheev, M. A. Stepovich, and E. V. Shirokova, “The depth distribution function of characteristic x-radiation in local electron-probe analysis,” Izv. Ross. Akad. Nauk. Ser. Fiz., 74, No. 7, 1043–1049 (2010).

2. Yu. G. Lavrent’ev, V. N. Korolyuk, and L. V. Usova, “The second generation of methods of correction in x-ray spectrum microanalysis: approximation models for the radiation depth distribution function,” Zh. Analit. Khimii, 59, No. 7, 678–696 (2004).

3. N. N. Mikheev, M. A. Stepovich, and E. V. Shirokova, “Consideration of matrix effects in local electron-probe analysis using a new model of the depth distribution function of characteristic x-radiation,” Izv. Ross. Akad. Nauk. Ser. Fiz., 76, No. 9, 1086–1089 (2012).

4. R. Castaing and J. Henoc, “Répartition en profondeur du rayonnement caractéristique,” Proc. 4th Congr. Int. Opt. Rayons X, Microanalyse, Paris (1966), pp. 120–126.

5. M. Green, The Efficiency of Production of Characteristic x-Radiation: PhD Thesis, Univ. Cambridge (1962).

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