1. G. Binning, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett., 56, 930 (1986).
2. V. L. Mironov, Principles of Scanning Probe Microscopy [in Russian], Izd. IFM Ross. Akad Nauk, Nizh. Novgorod (2004).
3. E. G. Dalkova et al., Probe Microscopy Instruments and Methods [in Russian], Izd. Mozhaiskii Poligraf. Kombinat, Moscow (2011).
4. Yu. A. Novikov, A. V. Rakov, and P. A. Todua, “Calibration of atomic force microscopes,” Izv. Ross. Akad Nauk, Ser. Fiz., 73, No. 4, 473–484 (2009).
5. GOST R 8.635-2007, GSI. Scanning Probe Atomic Force Microscopes. Calibration Procedure.