1. V. M. Shakhparonov, A. G. Parkhomov, and O. V. Karagioz, Metrologiya, No. 4, 26 (2008).
2. V. A. Letin, V. R. Zayavlin, and I. A. Gubanova, Elektrotekh. Prom. Ser. 22. Current Sources: Survey Information, issue 22, 1 (1988).
3. O. V. Karagioz, V. P. Izmailov, and M. A. Kudryavitskii, Izmer. Tekh., No. 12, 3 (1998);
4. Measure. Tech., 41, No. 12, 1091 (1998).
5. E. V. Pavlikhin, A. V. Stepanov, and V. M. Shakhparonov, “Noise and degradation processes in semiconductor devices,” in: Proc. Scientific and Technical Seminar, Moscow Energy Institute (2004), p. 188.