Author:
Cross B. J.,Lamb R. D.,Ma S.,Paque J. M.
Reference18 articles.
1. M. C. Nichols, D. R. Boehme, R. W. Ryon, D. C. Wherry, B. J. Cross and G. A. Aden, Parameters Affecting X-ray Micro-Fluorescence (XRMF) Analysis, Adv. X-Ray Analysis 30:45 (1987).
2. D. C. Wherry, B. J. Cross and T. H. Briggs, An Automated X-Ray Micro-Fluorescence Materials Analysis System, Adv. X-Ray Analysis 31:93 (1988).
3. B. J. Cross and J. E. Augenstine, Trace Analysis using EDS: Applications to Thin-Film and Heterogeneous Samples, accepted for publication in Adv. X-Ray Analysis 34: (1991).
4. T. Shiraiwa and N. Fujino, Micro Fluorescent X-ray Analyzer, Adv. X-Ray Analysis, 11:95 (1968).
5. Y. Shimura and S. Kozaki, X-Ray Scanning Microanalyzer, “Proc. 6th Intl. Conf. X-Ray Optics and Microanalysis,” eds. G. Shinoda, K. Kohra and T. Ichinokawa, Univ. Tokyo Press (1972).
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