The Use of Multilayer Structures in the Energy Dispersive X-ray Fluorescence Analysis of Low Z Elements-Reference-Cited by-同舟云学术

The Use of Multilayer Structures in the Energy Dispersive X-ray Fluorescence Analysis of Low Z Elements

Published:1994 Issue: Volume: Page:535-544
ISSN:
Container-title:Advances in X-Ray Analysis
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Author:

Kanngieβer Birgit,Beckhoff Burkhard,Scheer Jens,Swoboda Walter,Laursen Jens

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-2528-8_65.pdf

Reference4 articles.

1. Nicolosi, J. A., Groven, J. P., Merlo, D., “The use of Layered Synthetic Microstructures for quantitative analysis of elements: boron to magnesium”. Advances in X-Rax Analysis 30:183–192 (1986).

2. Eenbergen, A. v., Volbert, B., “Layered Synthetic Microstructures in sequential and simultaneous X-Ray Spectrometry”, Advances in X-Ray Analysis 30:201–211 (1986).

3. Marshall, G. F., “Monochromatization by Multilayered Optics on a Cylindrical Reflector and on an Ellipsoidal Focusing Ring”, Optical Engineering, Vol. 25, No. 8 (1986).

4. Marshall, G. F., “A unified geometrical insight for the design of toroidal reflectors with multilayered optical coatings: figured x-ray optics”, Applications of Thin-Film Multilayered Structures to Figured X-Ray Optics, G. F. Marshall, ed., Proc SPIE 563:114–134 (1985).

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