Grain-Boundary Films in A Silicon Nitride Ceramic at High Temperatures
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Publisher
Springer US
Link
http://link.springer.com/content/pdf/10.1007/978-1-4615-5393-9_10
Reference25 articles.
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3. D.R. Clarke, On the equilibrium thickness of intergranular glass phases, J. Am. Ceram. Soc., 70:15 (1987).
4. M.K. Cinibulk, H.-J. Kleebe, and M. Rühle, Quantitative comparison of TEM techniques for determining amorphous intergranular film thickness, J. Am. Ceram. Soc., 76:426 (1993).
5. H.-J. Kleebe, M.K. Cinibulk, R.M. Cannon, and M. Rühle, Statistical analysis of the intergranular film thickness in silicon nitride ceramics, J. Am. Ceram. Soc., 76:1969 (1993).
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