A Second Generation Automated Powder Diffractometer Control System-Reference-Cited by-同舟云学术

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A Second Generation Automated Powder Diffractometer Control System

Published:1982 Issue: Volume: Page:245-260
ISSN:
Container-title:Advances in X-Ray Analysis
language:
Short-container-title:

Author:

Snyder Robert L.,Hubbard Camden R.,Panagiotopoulos Nicolas C.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-9993-3_38.pdf

Reference13 articles.

1. Goehner, R. P. and Hatfield, W. T., Peak Search-A Program to Find Diffraction Peaks, Private Communication (1981).

2. Mallory, C. L. and Snyder, R. L., The Alfred University X-Ray Powder Diffraction Automation System, New York State College of Ceramics, Technical Paper No. 144.

3. Szabo, P., Optimization of Quantitative X-Ray Diffraction Analysis, J. Appl. Cryst., 13: 479 (1980).

4. Cohen, J. B. and Schlosberg, W. H., Interpreting X-Ray Scattering, Industrial R/D, p. 105 (1978).

5. Snyder, R. L., Hubbard, C. R., and Pantiotopolous, N. C., AUTO: A Real Time Diffractometer Control System, NBSIR 81–2229, NBS, Washington, D.C. (1981).

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Alignment and Maintenance of Powder Diffractometers;Introduction to X-ray Powder Diffractometry;2012-09-04

2. Quantitative Analysis;Introduction to X-ray Powder Diffractometry;2012-09-04

3. Acquisition of Diffraction Data;Introduction to X-ray Powder Diffractometry;2012-09-04

4. Powder-Pattern: A System of Programs for Processing and Interpreting Powder Diffraction Data;Advances in X-ray Analysis;1982

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