Non-Destructive Chemical-State Analysis of Thin Films and Surface Layers (1–1000 NM) by Low-Energy Electron Induced X-Ray Spectroscopy (Leeixs)-Reference-Cited by-同舟云学术

Non-Destructive Chemical-State Analysis of Thin Films and Surface Layers (1–1000 NM) by Low-Energy Electron Induced X-Ray Spectroscopy (Leeixs)

Published:1990 Issue: Volume: Page:247-259
ISSN:
Container-title:Advances in X-Ray Analysis
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Author:

Gyani Angeli K.,McClusky Phillip,Urch David S.,Charbonnier M.,Gaillard F.,Romand M.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-9996-4_27.pdf

Reference16 articles.

1. M. Romand, R. Bador, M. Charbonnier and F. Gaillard, Surface and Near-Surface Chemical Characterization by Low-Energy Electron Induced X-ray Spectrometry [LEE1XS]: A Review, X-Ray Spectrometry, 16: 7 [1987].

2. F. Gaillard and M. Romand, Applications de la spectrométrie d’émission de rayons — X [LEEIXS] à l’étude des matériaux isolants. Cas de quelques oxydes metalliques, Le Vide, les Couches Minces, supp. to Vol 243: 231 [1988].

3. D.S. Urch, X-ray Emission Spectroscopy, in: ‘Electron Spectroscopy-Theory. Techniques and Applications’, G.R. Brundle and A.D. Baker, eds; Academic Press, London, 3: 1 [1979].

4. R. Horn and D.S. Urch, Chemical Effects in the X-ray emission spectra of sulphur, Spectrochimica Acta B, 42: 1177 [1987].

5. D.E. Day, Determining the Coordination Number of aluminium ions by X-ray emission spectroscopy. Nature, 200: 649 [1963].

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1. Problems in the Use of Multilayers for Soft X-Ray Spectroscopy and Analysis: A Comparison of Theoretically and Experimentally Determined Refraction Effects;Advances in X-Ray Analysis;1992

2. Recent Developments in Surface and Thin Film Analysis Using Low - Energy Electron Induced X - Ray Spectrometry (LEEIXS);Advances in X-Ray Analysis;1992