Application of Multi-Layer Thin Film Analysis by X-Ray Spectrometry using the Fundamental Parameter Method-Reference-Cited by-同舟云学术

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Application of Multi-Layer Thin Film Analysis by X-Ray Spectrometry using the Fundamental Parameter Method

Published:1990 Issue: Volume: Page:225-235
ISSN:
Container-title:Advances in X-Ray Analysis
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Author:

Kataoka Y.,Arai T.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-9996-4_25.pdf

Reference8 articles.

1. T. Shiraiwa and N. Fujino, Adv. X-ray Anal., 12 (1968), p.446

2. T.C. Huang and W. Parrish, Anal. Chem., 49 (1977), p.1152

3. T. Arai, Adv. X-ray Anal., 30 (1987), p.315

4. J. Willis, Adv. X-ray Anal., 31 (1988), p. 175

5. H. Kohno, M. Murata, Y. Kataoka and T. Arai, Japan Adv. X-ray Anal., 19 (1988), p.307

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Thickness Measurements of Thin Bulk Film By X-Ray Method;Advances in X-Ray Analysis;1991

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