A Microcomputer Controlled Diffractometer-Reference-Cited by-同舟云学术

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A Microcomputer Controlled Diffractometer

Published:1979 Issue: Volume: Page:165-167
ISSN:
Container-title:Advances in X-Ray Analysis
language:
Short-container-title:

Author:

Goehner R. P.,Hatfield W. T.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-9987-2_15.pdf

Reference6 articles.

1. Jenkins, R., Haas, D., and Paoline, F. R., Norelco Reporter, 18, 12–27, (1972).

2. Jenkins, R., and Westberg, R. G., Advances in X-Ray Analysis, 16, 310–321 (1973).

3. Holland, H. J., and Medrud, R. C., J. Appl. Cry st., 10, 386–389, (1977).

4. King, P. J. and Smith, W. L., J. Appl. Cry s t., 7, 603–608 (1974).

5. Parrish, W., Huang, T. C., and Ayers, G. L., Trans. ACA 12, 55–73 (1976).

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Qualitative Analysis;Introduction to X-ray Powder Diffractometry;2012-09-04

2. Reduction of Data from Automated Powder Diffractometers;Introduction to X-ray Powder Diffractometry;2012-09-04

3. X-Ray Diffraction Quantitative Analysis Using Intensity Ratios and External Standards;Advances in X-Ray Analysis;1982

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