1. L. S. Birks, X-ray Spectrochemical Analysis, p. 71–79, John Wiley and Sons, Inc. (1969).
2. H. A. Liebhafsky, H. G. Pfeiffer, E. H. Winslow, and P. D. Zemany, X-ray Absorption and Emission in Analytical Chemistry, p. 179–191, John Wiley and Sons, Inc. (1960).
3. T. Shiraiwa and N. Fujino, “Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-rays,” in C. S. Barrett, J. B. Newkirk, and G. R. Mallett, Editors, Advances in X-ray Analysis, Vol. 12, p. 1+1+6–1+55, Plenum Press (1969).
4. R. Barbier, “Analytical Chemistry - On a Method of Absolute Quantitative Elemental Analysis by X-ray Fluorescence Spectrometry,” Proceedings Academy Science, Paris, Vol. 270, p. 1581–1584 (May 11, 1970 ).
5. Reference (2), p. 153–158.