Rapid Recording of Powder Diffraction Patterns with Si(Li) X-Ray Energy Analysis System: W and Cu Targets and Error Analysis-Reference-Cited by-同舟云学术

Rapid Recording of Powder Diffraction Patterns with Si(Li) X-Ray Energy Analysis System: W and Cu Targets and Error Analysis

Published:1972 Issue: Volume: Page:240-253
ISSN:
Container-title:Advances in X-Ray Analysis
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Author:

Sparks Cullie J.,Gedcke Dale A.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-9969-8_17

Reference7 articles.

1. B. C. Giessen and G. E. Gordon, “X-Ray Diffraction: New High Speed Technique Based on X-ray Spectrography,” Science 159, 973–975 (1968).

2. Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis, Amer. Soc. Test. Mater. Spec. Tech. Pal. 485, American Society for Testing and Materials, Philadelphia (1971).

3. I. G. Edmunds, H. Lipson, and H. Steeple, “The Determination of Accurate Lattice Parameters,” Chap. 15 in X-Ray Diffraction by Polycrystalline Materials, ed. by H. S. Peiser, H. P. Roaksby, and A.J.C. Wilson, The Institute of Physics, London (1955).

4. J. A. Bearden, X-Ray Wavelengths, NY0–10586, U.S. Atomic Energy Commission, Division of Technical Information (1964).

5. A.J.C. Wilson, “Geiger-Counter X-Ray Spectrometer — Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction Maxima,” J. Sci. Insti. 27, 321–325 (1950).

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