Author:
Martin-Martinez Javier,Rodriguez Rosana,Nafria Montse
Reference79 articles.
1. J. Hicks et al., Intel Technology Journal
12, 131 (2008).
2. A. Haggag, et. Al., IEEE Int. Reliab. Phys.Symp. (IRPS) Proc. 93 (2006).
3. Dieter K. Schroder and Jeff A. Babcock, J. Appl. Phys. 94, 1 (2003)
4. E. Takeda, E. Murakami, K. Torii, Y. Okuyama, E. Ebe, K. Hinode, and S.Kimura, Microelectron. Reliab. 42, 493 (2002).
5. M. M. Albert and N. H. Tolk, Phys. Rev. B 63, 035308 (2001).
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