1. J. J. Thomson, Phil. Mag. 20,752 (1910).
2. R. E. Honig, J. Appl. Phys. 29, 549 (1958).
3. R. E. Honig, in Secondary Ion Mass Spectrometry SIMS V, (A. Benninghoven, R. J. Colton, D. S. Simons, and H. W. Verner, eds.), Springer-Verlag, New York (1986), p. 2.
4. See, e.g., Secondary Ion Mass Spectrometry SIMS VI, (A. Benninghoven, A. M. Huber, and H. W. Werner, eds.), John Wiley and Sons, New York, (1988).
5. A. W. Czanderna, Chap. 1, this volume, Refs. 40–49.