Secondary Ion Mass Spectrometry — Fundamentals and Application to Heterogeneous Catalysis-Reference-Cited by-同舟云学术

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Secondary Ion Mass Spectrometry — Fundamentals and Application to Heterogeneous Catalysis

Published:1991 Issue: Volume: Page:357-392
ISSN:0258-1221
Container-title:Fundamental Aspects of Heterogeneous Catalysis Studied by Particle Beams
language:
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Author:

Reed N. M.,Vickerman J. C.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4684-5964-7_27

Reference76 articles.

1. J.J. Thomson, (1910), Phil. Mag., 20, 252

2. R.F.K. Herzog and F.P. Viebock, (1949), Phys. Rev., 76, 855L

3. R. E. Honig, (1958), J. Appl. Phys, 29, 549

4. A. Benninghoven, (1970), Z. Physik, 230, 403

5. P.D. Prewett and D.K. Jeffries, (1980), Inst. Phvsics Conf. Ser., 54, 316

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ChemInform Abstract: Secondary Ion Mass Spectrometry - Fundamentals and Application to Heterogeneous Catalysis;ChemInform;2010-08-21

2. Surface Chemical Composition;Handbook of Heterogeneous Catalysis;2008-03-15

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