1. Beali J, Wilson D. “Curve Tracer Applications and Hints for Failure Analysis.” In Microelectronics Failure Analysis Desk Reference, 3rd Edition. Metals Park: ASM International, 1993.
2. Stabb D, Appleman D. Failure Analysis of Complex and High Pin Count Devices Using Computer Aided Electrical Characterization. Proceeding International Symposium for Testing and Failure Analysis, 1989, 261.
3. Appleman D, Wong F. Computerized Analysis and Comparison of IC Curve Trace Data and Other Device Characteristics. Proceeding International Symposium for Testing and Failure Analysis, 1990, 271.
4. Lycoudes N, Childers C. Semiconductor Instability Failure Mechanisms Review. IEEE Transactions of Reliability, R-29,(3), 1980, 237.
5. Sze S. M. Physics of Semiconductor Devices. John Wiley & Sons, 1981.