Residual Stress Measurements in Ti-6Al-4V and α-Brass with Sub-Surface Flaws Using X-Ray Diffraction Techniques-Reference-Cited by-同舟云学术

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Residual Stress Measurements in Ti-6Al-4V and α-Brass with Sub-Surface Flaws Using X-Ray Diffraction Techniques

Published:1984 Issue: Volume: Page:39-46
ISSN:
Container-title:Nondestructive Methods for Material Property Determination
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Author:

Alreja Vijay,Liu John M.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4684-4769-9_3

Reference9 articles.

1. General Dynamics, FZM-12–13108;JH Ashton,1970

2. B. D. Cullity, “Elements of X-ray Diffraction”, Addison Wesley Pub. Co., Reading, Mass., Ch. 16, (1970).

3. P. H. Klug and E. L. Alexander, “X-ray Diffraction Procedures”, John Wiley and Sons, Wev York, Chapter 10, (1962).

4. D. P. Koistinen and R. E. Margurger, ASM Transactions, Vol. 51, pp. 537, (1959).

5. C. Kim, Advances in X-ray Analysis, Vol. 25, pp. 343, (1981).

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