Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique-Reference-Cited by-同舟云学术

Ageing and Lifetime of Electronic Components Studies By Means of a High-Resolution In-Situ Measurement Technique

Published:2001 Issue: Volume: Page:291-296
ISSN:
Container-title:Ageing Studies and Lifetime Extension of Materials
language:
Short-container-title:

Author:

Croes K.,Manca J. V.,De Ceuninck W.,De Schepper L.,Tielemans L.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-1215-8_32

Reference15 articles.

1. L. De Schepper, W. De Ceuninck, L. Stals and J. Roggen, “Method and device for accelerated determining of ageing of one or more elements with an electromagnetic ageing parameter”, European Patent EP 0395 149 Al; US Patent Serial No. 08/372.382 (1997)

2. European patent request LTSCAL: Local Temperature Densing, patent number EP 0 733 909 Al., published in 1996 with application number 96200817.3, introduced in the USA in 1997 as “Method and Apparatus for Local Temperature Sensing for High Resolution In-situ Measurements, serial number 08/620.250

3. J. V. Manca, K. Croes, L. De Schepper, W. De Ceuninck, L.M. Stals, L. Jacques, L.Tielemans, N. Gerrits and R. Hoppener, “Electrical characterisation and reliability evaluation of capacitors by means of in situ leakage current measurements”, Quality and Reliability Engineering International, Vol. 14, pp. 63-68,1998

4. W. De Ceuninck, V. D’Haeger, J. Van Olmen, A. Witvrouw, K. Maex, L. De Schepper, P. De Pauw and A. Pergoot, “The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines”, Microelectronics and Reliability, Vol. 38, pp. 87-98,1998

5. I. Czech, J. Manca, J. Roggen, G. Huyberechts, L. Stals and L. De Schepper, “Electrical characterisation and reliability studies of thick film gas sensors structures”, Proceedings of the 1996 IEEE International Conference on Microelectronic Structures, Vol. 9,1996

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