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Introduction

Published:1975 Issue: Volume: Page:1-19
ISSN:
Container-title:Practical Scanning Electron Microscopy
language:
Short-container-title:

Author:

Goldstein J. I.,Yakowitz H.,Newbury D. E.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-4422-3_1.pdf

Reference52 articles.

1. A. N. Broers, in Scanning Electron Microscopy/1974, IITRI, Chicago, Illinois (1974) p. 9.

2. V. K. Zworykin, J. Hillier, and R. L. Snyder, ASTM Bull. 117, 15 (1942).

3. M. von Ardenne, Z. Phys., 109, 553 (1938).

4. M. von Ardenne, Z. Techn. Phys., 19, 407 (1938).

5. D. McMullan, Ph.D. Dissertation, Cambridge University (1952).

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3. 90° Domain Configuration and Lateral Domain Wall Motion in BaTiO₃ Evaluated by Secondary Electron Microscopy;Key Engineering Materials;2004-05

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