1. M. Hilley, J. A. Larson, C. F. Jatczak, and R. E. Ricklefs, Editors, “Residual Stress Measurement by X-Ray Diffraction,” SAE Information Report No. J784a, (1971)-
2. E. W. Weinman, J. E. Hunter, and D. D. McCormack, “Determining Residual Stresses Rapidly,” Metal Progress, July 1969, p 88–90.
3. G-. Koves and C. Y. Ho, “Computer Automated X-Ray Stress Analysis,” Norelco Reporter, Volume 11, p 99–103, (1964)
4. C.J. Kelly and M. A. Short, “A Paper Tape Controlled X-Ray Diffractometer for the Measurement of Retained Austenite,” in K. F. Heinrich, C. S. Barrett, J. B. Newkirk, and C. O. Ruud, Editors, Advances in X-Ray Analysis, Vol. 15, P 102–113, Plenum Press (1972).
5. F. Kunz, E. Eichen, H. Matthews, and J. Francis, “An Automated Electron Microprohe System,” Ibid, p 148–102.