Sensitivity and Detectability Limits for Elemental Analysis by Proton-Induced X-Ray Fluorescence with a 3 MV van de Graaff

Author:

Umbarger C. J.,Bearset R. C.,Close D. A.,Malanify J. J.

Publisher

Springer US

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Trace elemental analysis of adenoma and carcinoma thyroid by PIXE method;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-11

2. Chapter 5 Analysis by heavy ion induced X-ray emission;Progress in Crystal Growth and Characterization;1984-01

3. Proton-Induced X-Ray Emission Analysis;C R C Critical Reviews in Analytical Chemistry;1981-01

4. Proton Induced X-Ray Emission Analysis: Part I;C R C Critical Reviews in Analytical Chemistry;1981-01

5. Proton induced X-ray emission (PIXE) — A new tool in geochemistry;Chemical Geology;1979-05

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