X-Ray Diffraction Topography: Application to Crystal Growth and Plastic Deformation-Reference-Cited by-同舟云学术

X-Ray Diffraction Topography: Application to Crystal Growth and Plastic Deformation

Published:1996 Issue: Volume: Page:167-176
ISSN:0258-1221
Container-title:X-Ray and Neutron Dynamical Diffraction
language:
Short-container-title:

Author:

Klapper Helmut

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-5879-8_10

Reference11 articles.

1. Authier, A., 1977, X-ray and neutron topography of solution-grown crystals, in: 1976 Crystal Growth and Materials (Current Topics in Materials Science, Vol. 2, p. 516), E. Kaldis and H.J. Scheel, eds., North Holland, Amsterdam.

2. Authier, A., 1978, Contrast of images in X-ray topography, In: Diffraction and Imaging Techniques in Materials Science, S. Amelinckx, R. Gevers and J. Van Landuyt, eds., North Holland, Amsterdam, p. 715.

3. Bhat, H.L., 1985, X-ray topographic assessment of dislocations in crystals grown from solution; in: Progress in Ciystal Growth and Characterization, Vol. 11, p. 57, B.R. Pamplin, ed., Pergamon, Oxford.

4. Bonse, U.K., Hart, M. and Newkirk, J.B., 1967, X-ray diffraction topography, in: Advances in X-Ray Analysis, Vol. 10, p.1, J.B. Newkirk and G.R. Mallet, eds., Plenum Press, New York.

5. Klapper, H., 1980, Defects in non-metal crystals, in: Characterization of Ciystal Growth Defects by X-Ray Methods, B.K. Tanner and D.K. Bowen, eds., Plenum Press, New York, p. 133.

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