Reflection Electron Microscopy in TEM and STEM Instruments

Author:

Cowley J. M.

Publisher

Springer US

Reference48 articles.

1. D. J. Smith, in: “Physics and Chemistry of Solid Surfaces”, Vol. VI, Springer-Verlag, Heidelberg, Chapter 15 (1986).

2. K. Yagi, in: “High Resolution Transmission Electron Microscopy”, P. R. Buseck, L. Eyring and J. M. Cowley, eds., Oxford Univ. Press, Oxford, in press (1988).

3. K. Yagi, J. Appl. Cryst., 20:147 (1987) and in this volume, p. 285.

4. J. M. Cowley, Progr. Surface Sci., 21:209 (1968a).

5. J. M. Cowley, in: “Electron Microscopy 1986”, Y. Imura, S. Maruse and T. Suzuki, eds., The Japanese Soc. Electron Microscopy, Tokyo, Vol 1:3 and 71 (1986b).

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