Electromechanical Conversion in MS-Contacts; Determination of Frequency Response, Depletion Depths and Energy Levels-Reference-Cited by-同舟云学术

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Electromechanical Conversion in MS-Contacts; Determination of Frequency Response, Depletion Depths and Energy Levels

Published:1980 Issue: Volume: Page:333-336
ISSN:
Container-title:Phonon Scattering in Condensed Matter
language:
Short-container-title:

Author:

Fossheim K.,Raaen A. M.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-3063-9_76

Reference4 articles.

1. K. Fossheim and L. Bjerkan, Appl.Phys.Letters 32, 199 (1978); L. Bjerkan, J.O. Fossum and K. Fossheim, J.Appl.Phys. (in press)

2. H.K. Henisch, Rectifying semiconductor contacts, Oxford, at the Clarendon Press (1957)

3. A.M. Raaen and K. Fossheim, J.Phys.C. (to be published)

4. K. Fossheim, R.M. Holt and A.M. Raaen, J.Appl.Phys. (in press)

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