1. S. Tolansky, Multiple-Beam Interferometry of Surfaces and Films, Oxford University Press, London, 1949.
2. The Preparation and Characteristics of Thin Ferromagnetic Films, Final Eng. Report, Contract AF 19(604) 2659, Appendix A, Remington Rand Univac, November 1958.
3. T.C. Loomis, “Analysis of Thin Films of Iron-Nickel Alloys on Glass,” 9th Annual Symposium on Spectroscopy, Chicago, Ill., June 1958.
4. A. Month, M. Schindler, and J. Antales, “Measurement of Composition and Thickness of Iron-Nickel Films by X-Ray Fluorescence Techniques,” Pittsburgh Conference of Analytical Chemistry and Applied Spectroscopy, February-March 1961.
5. E.G. Feiten, Isidor Fankuchen, and Joseph Steigman, “A Possible Solution of the Matrix Problem in X-Ray Fluorescence Spectroscopy,” Anal. Chem. Vol. 31, 1959, p. 1771.