Author:
Sthal Fabrice,Cretin Bernard
Reference11 articles.
1. W. Dürr, D.A. Sinclair, E. A. Ash, A high resolution acoustic probe, Electron. Lett. 21:805 (1980).
2. J. K. Zienuk, A. Latuszek, Ultrasonic pin scanning microscope. A new approach to ultrasonic microscopy, Proceedings IEEE Ultrasonics Symposium, Williamsburg, B.R. Mc Avoy, ed., Pittsburgh, pp. 1037–1039 (1986).
3. B. T. Khuri-Yakub, S. Akamine, B. Hadimioglu, H. Yamada and C.F. Quate, Near field acoustic microscopy, SPIE, 1556, Scanning Microscopy Instrumentation, 30 (1991).
4. K. Takata, T. Hasegawa, S. Hosaka, S. Hosoki, T. Komoda, Tunneling acoustic microscope, Appl. Phys. Lett 55:1718 (1989).
5. P. Günther, U. Ch. Fisher, K. Dransfeld, Scanning nearfield acoustic microscopy, Appl Phys. B, 48:89 (1989).
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献